Beilstein J. Nanotechnol.2017,8, 2307–2314, doi:10.3762/bjnano.8.230
controllable nanoscale dimensions can be designed and fabricated for integration of MOF systems directly into device architectures and sensor platforms.
Keywords: atomic force microscopy; copper(II) 1,3,5-benzenetricarboxylate; ellipsometry; surface-anchored metal-organic frameworks; Introduction
Metal
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Figure 1:
Representative AFM images of HKUST-1 surMOFs fabricated via codeposition at 25 °C on SAM-coated Au ...